国外标准列表
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[国外标准] JIS C5750-3-1-2006 Dependability management Part 3-1 Application guide Analysis techniques for depen
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[国外标准] JIS C5630-3-2009 Semiconductor devices-Micro-electromechanical devices- Part 3 Thin film standard te
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[国外标准] JIS C5630-2-2009 Semiconductor devices-Micro-electromechanical devices- Part 2 Tensile testing metho