JIS资源列表
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[国外标准] JIS C5750-3-1-2006 Dependability management Part 3-1 Application guide Analysis techniques for depen
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[国外标准] JIS C5630-3-2009 Semiconductor devices-Micro-electromechanical devices- Part 3 Thin film standard te
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[国外标准] JIS C5630-2-2009 Semiconductor devices-Micro-electromechanical devices- Part 2 Tensile testing metho
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[国外标准] JIS C5630-1-2008 Semiconductor devicesMicro-electromechanical devices Part 1 Terms and definitions
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[国外标准] JIS C5533-4-2008 Audio and audiovisual equipment-Digital audio parts- Basic measurement methods of a
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[国外标准] JIS C5533-2-2008 Audio and audiovisual equipment-Digital audio parts- Basic measurement methods of a